[IEEE 2012 19th IEEE International Symposium on the...

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[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Noble Failure Analysis procedure for trench MOSFET technology devices through detail electrical parameter characterization and unique Fault Isolation technique

Yahya, Abul Khair, Yusof, Nik Tajuddin, Yusof, Yusnani Mohamad
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Year:
2012
Language:
english
DOI:
10.1109/IPFA.2012.6306269
File:
PDF, 1.25 MB
english, 2012
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