[IEEE 2012 12th Annual Non-Volatile Memory Technology Symposium (NVMTS) - Singapore, Singapore (2012.10.31-2012.11.2)] 2012 12th Annual Non-Volatile Memory Technology Symposium Proceedings - Temperature and series resistance effect on electrical characteristics of epitaxial diode array for phase-change memory application
Liu, Yan, Song, Zhitang, Liu, Bo, Chen, Houpeng, Wu, Guanping, Zhang, Chao, Wang, Lianhong, Wang, Lei, Feng, SonglinYear:
2013
Language:
english
DOI:
10.1109/NVMTS.2013.6632867
File:
PDF, 643 KB
english, 2013