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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST
Mukherjee, N., Pogiel, A., Rajski, J., Tyszer, J.Year:
2008
Language:
english
DOI:
10.1109/TEST.2008.4700554
File:
PDF, 323 KB
english, 2008