[IEEE 2002 Annual Reliability and Maintainability Symposium...

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[IEEE 2002 Annual Reliability and Maintainability Symposium (RAMS) - Seattle, WA, USA (28-31 Jan. 2002)] Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) - Risk analysis using a hybrid Bayesian-approximate reasoning methodology

Bott, T.F., Eisenhawer, S.W.
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Year:
2002
Language:
english
DOI:
10.1109/RAMS.2002.981630
File:
PDF, 416 KB
english, 2002
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