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[IEEE 2010 IEEE International Conference of Electron Devices and Solid- State Circuits (EDSSC) - Hong Kong (2010.12.15-2010.12.17)] 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Modeling of flicker noise in n-channel FinFETs: Mobility fluctuations in the subthreshold region
Pandit, S, Syamal, B, Sarkar, C KYear:
2010
Language:
english
DOI:
10.1109/EDSSC.2010.5713699
File:
PDF, 955 KB
english, 2010