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[IEEE Proceedings of 1994 IEEE International Reliability Physics Symposium - San Jose, CA, USA (1994.04.11-1994.04.14)] Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 - High field emission related thin oxide wearout and breakdown
Dumin, D.J., Mopuri, S., Vanchinathan, S., Scott, R.S., Subramoniam, R., Lewis, T.G.Year:
1994
Language:
english
DOI:
10.1109/RELPHY.1994.307844
File:
PDF, 1.25 MB
english, 1994