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[IEEE 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Cannes, France (10-13 Oct. 2004)] 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Probabilistic balancing of fault coverage and test cost in combined built-in self-test/automated test equipment testing environment
Shanrui Zhang,, Minsu Choi,, Nohpill Park,, Lombardi, F.Year:
2004
Language:
english
DOI:
10.1109/DFTVS.2004.1347824
File:
PDF, 339 KB
english, 2004