![](/img/cover-not-exists.png)
[IEEE Comput. Soc. Press 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Venice, Italy (27-29 Oct. 1993)] Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Analysis and comparison of fault tolerant FSM architecture based on SEC codes
Rochet, R., Leveugle, R., Saucier, G.Year:
1993
Language:
english
DOI:
10.1109/DFTVS.1993.595604
File:
PDF, 487 KB
english, 1993