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[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - A compact model of holding voltage for latch-up in epitaxial CMOS
Ming-Jer Chen,, Chin-Shan Hou,, Pin-Nan Tseng,, Ruey-Yun Shiue,, Hun-Shung Lee,, Jyh-Huei Chen,, Jeng-Kuo Jeng,, Yeh-Ning Jou,Year:
1997
Language:
english
DOI:
10.1109/RELPHY.1997.584284
File:
PDF, 542 KB
english, 1997