[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - On the Detectability of Scan Chain Internal Faults An Industrial Case Study
Yang, Fan, Chakravarty, Sreejit, Devta-Prasanna, Narendra, Reddy, Sudhakar M, Pomeranz, IrithYear:
2008
Language:
english
DOI:
10.1109/VTS.2008.13
File:
PDF, 482 KB
english, 2008