[IEEE 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics - Lviv, Ukraine (2007.2.19-2007.2.24)] 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics - Ellipsoidal Tolerances Analysis Ensuring Product Yield Probability
Voropay, OlexiyYear:
2007
Language:
english
DOI:
10.1109/CADSM.2007.4297577
File:
PDF, 436 KB
english, 2007