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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Test generator with preselected toggling for low power built-in self-test
Rajski, Janusz, Tyszer, Jerzy, Mrugalski, Grzegorz, Nadeau-Dostie, BenoitYear:
2012
Language:
english
DOI:
10.1109/VTS.2012.6231071
File:
PDF, 720 KB
english, 2012