[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - On the mechanical fatigue study of second-level interconnects using the E-N curve approach
Malatkar, Pramod, Chin, Ian, Chavarria, Jose, Kesavan, Rohini, Shaw Fong Wong,Year:
2008
Language:
english
DOI:
10.1109/ECTC.2008.4550087
File:
PDF, 459 KB
english, 2008