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[IEEE 2013 14th Latin American Test Workshop - LATW - Cordoba, Argentina (2013.04.3-2013.04.5)] 2013 14th Latin American Test Workshop - LATW - Low-cost DC BIST for analog circuits: A case study

Petrashin, Pablo, Dualibe, Carlos, Lancioni, Walter, Toledo, Luis
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Year:
2013
Language:
english
DOI:
10.1109/LATW.2013.6562668
File:
PDF, 1.27 MB
english, 2013
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