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[IEEE 23rd International Reliability Physics Symposium - Orlando, FL, USA (1985.03.25-1985.03.29)] 23rd International Reliability Physics Symposium - A Non-Aging Screen to Prevent Wearout of Ultra-Thin Dielectrics
Meyer, William K., Crook, Dwight L.Year:
1985
Language:
english
DOI:
10.1109/IRPS.1985.362067
File:
PDF, 5.47 MB
english, 1985