[IEEE 2013 IEEE International Test Conference (ITC) -...

  • Main
  • [IEEE 2013 IEEE International Test...

[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Predicting system-level test and in-field customer failures using data mining

Chen, Harry H., Hsu, Roger, Yang, PaulYoung, Shyr, J. J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2013
Language:
english
DOI:
10.1109/TEST.2013.6651892
File:
PDF, 1.30 MB
english, 2013
Conversion to is in progress
Conversion to is failed