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[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Predicting system-level test and in-field customer failures using data mining
Chen, Harry H., Hsu, Roger, Yang, PaulYoung, Shyr, J. J.Year:
2013
Language:
english
DOI:
10.1109/TEST.2013.6651892
File:
PDF, 1.30 MB
english, 2013