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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Fault diagnosis in designs with convolutional compactors
Mrugalski, G., Pogiel, A., Rajski, J., Tyszer, J., Chen Wang,Year:
2004
Language:
english
DOI:
10.1109/TEST.2004.1386986
File:
PDF, 742 KB
english, 2004