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[IEEE 2011 IEEE Nanotechnology Materials and Devices Conference (NMDC 2011) - Jeju (2011.10.18-2011.10.21)] 2011 IEEE Nanotechnology Materials and Devices Conference - In-situ TEM biasing experiments to study thickness-dependent ferroelectric domain switching of Pb(Zr,Ti)O3 films
Shin, Gayoung, Lee, Ho-Nyung, Im, Jiseong, Gu, Gil-Ho, Oh, Sang HoYear:
2011
Language:
english
DOI:
10.1109/NMDC.2011.6155296
File:
PDF, 607 KB
english, 2011