[IEEE 2008 IEEE Radiation Effects Data Workshop - Tucson, AZ (2008.07.14-2008.07.18)] 2008 IEEE Radiation Effects Data Workshop - TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory
Schmidt, H., Walter, D., Gliem, F., Nickson, B., Harboe-Sorensen, R., Virtanen, A.Year:
2008
Language:
english
DOI:
10.1109/REDW.2008.13
File:
PDF, 245 KB
english, 2008