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[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Impact of mid-bond testing in 3D stacked ICs
Taouil, Mottaqiallah, Hamdioui, Said, Marinissen, Erik Jan, Bhawmik, SudiptaYear:
2013
Language:
english
DOI:
10.1109/DFT.2013.6653603
File:
PDF, 247 KB
english, 2013