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[IEEE 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) - Stockholm, Sweden (2014.04.7-2014.04.9)] 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) - NBTI in p-channel power U-MOSFETs: Understanding the degradation and the recovery mechanisms
Tallarico, Andrea Natale, Magnone, Paolo, Barletta, Giacomo, Magri, Angelo, Sangiorgi, Enrico, Fiegna, ClaudioYear:
2014
Language:
english
DOI:
10.1109/ULIS.2014.6813919
File:
PDF, 326 KB
english, 2014