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[IEEE 2007 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2007.10.15-2007.10.18)] 2007 IEEE International Integrated Reliability Workshop Final Report - Scaling tunneling oxide to 50Å in floating-gate logic NVM at 65nm and beyond
Bin Wang,, Niset, Martin, Yanjun Ma,, Hoc Nguyen,, Paulsen, RonYear:
2007
Language:
english
DOI:
10.1109/IRWS.2007.4469220
File:
PDF, 191 KB
english, 2007