[IEEE 2008 IEEE International Test Conference - Santa...

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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Parametric Testing of Optical Interfaces

Achkir, B., Zivny, P., Eklow, B.
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Year:
2008
Language:
english
DOI:
10.1109/TEST.2008.4700655
File:
PDF, 33 KB
english, 2008
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