[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Parametric Testing of Optical Interfaces
Achkir, B., Zivny, P., Eklow, B.Year:
2008
Language:
english
DOI:
10.1109/TEST.2008.4700655
File:
PDF, 33 KB
english, 2008