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[IEEE Exhibition - Singapore (2008.05.19-2008.05.23)] 2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility - Novel Specific Absorption Rate measurement techniques
Onishi, Teruo, Kiminami, Katsuki, Iyama, TakahiroYear:
2008
Language:
english
DOI:
10.1109/APEMC.2008.4559826
File:
PDF, 456 KB
english, 2008