[IEEE 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - Tempe, AZ, USA (2012.10.21-2012.10.24)] 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems - Measurement of SSO noise and PDN impedance of 3D SiP with 4k-IO widebus structure
Tanaka, Yosuke, Takatani, Hiroki, Fujita, Haruya, Oizono, Yoshiaki, Nabeshima, Yoshitaka, Sudo, Toshio, Sakai, Atsushi, Uchiyama, Shiro, Ikeda, HiroakiYear:
2012
Language:
english
DOI:
10.1109/EPEPS.2012.6457850
File:
PDF, 5.80 MB
english, 2012