[IEEE IECON 2012 - 38th Annual Conference of IEEE Industrial Electronics - Montreal, QC, Canada (2012.10.25-2012.10.28)] IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society - Model-based fault detection and isolation algorithm of current sensor for IPMSM
Byunghwan Lee,, Namju Jeon,, Hyeongcheol Lee,Year:
2012
Language:
english
DOI:
10.1109/IECON.2012.6389529
File:
PDF, 2.18 MB
english, 2012