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Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries
Wright, Stuart I., Nowell, Matthew M., de Kloe, René, Chan, LisaVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192761400035X
Date:
June, 2014
File:
PDF, 1.60 MB
english, 2014