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[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry
Mojumder, Niladri Narayan, Mukhopadhyay, Saibal, Kim, Jae-Joon, Chuang, Ching-Te, Roy, KaushikYear:
2008
Language:
english
DOI:
10.1109/VTS.2008.26
File:
PDF, 643 KB
english, 2008