[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Differential scan-path: A novel solution for secure design-for-testability
Manich, S., Wamser, Markus S., Guillen, Oscar M., Sigl, G.Year:
2013
Language:
english
DOI:
10.1109/TEST.2013.6651902
File:
PDF, 1.75 MB
english, 2013