[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - ESD protection window targeting using LDMOS-SCR devices with PWELL-NWELL super-junction
Vashchenko, V.A., ter Beek, M.Year:
2005
Language:
english
DOI:
10.1109/RELPHY.2005.1493168
File:
PDF, 377 KB
english, 2005