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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Fast Memory Footprint Estimation based on Maximal Dependency Vector Calculation

Hu, Q., Vandecappelle, A., Kjeldsberg, P. G., Catthoor, F., Palkovic, M.
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Year:
2007
Language:
english
DOI:
10.1109/DATE.2007.364621
File:
PDF, 326 KB
english, 2007
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