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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Circuit extraction via time-domain vector fitting
Grivet-Talocia, S., Canavero, F.G., Stievano, I.S., Maio, I.A.Year:
2004
Language:
english
DOI:
10.1109/ISEMC.2004.1349964
File:
PDF, 436 KB
english, 2004