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[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Ensuring IC Reliability by Automated Design Checks
Chawda, Pradeep, Rajeswaran, M, Joy, Jomy, Suresh, P RYear:
2007
Language:
english
DOI:
10.1109/IPFA.2007.4378083
File:
PDF, 1.12 MB
english, 2007