[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Error immunity techniques for nanomagnetic logic
Lambson, Brian, Gu, Zheng, Bokor, Jeffrey, Carlton, David, Dhuey, ScottYear:
2012
Language:
english
DOI:
10.1109/IEDM.2012.6479025
File:
PDF, 694 KB
english, 2012