[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Performance verification of instruments adopted for voltage dip measurement
Gallo, Daniele, Landi, Carmine, Luiso, MarioYear:
2010
Language:
english
DOI:
10.1109/IMTC.2010.5488025
File:
PDF, 676 KB
english, 2010