![](/img/cover-not-exists.png)
[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Multi-camera Platform Calibration Using Multi-linear Constraints
Nyman, Patrik, Heyden, Anders, Astrom, KalleYear:
2010
Language:
english
DOI:
10.1109/ICPR.2010.22
File:
PDF, 1.37 MB
english, 2010