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[IEEE Comput. Soc 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - San Francisco, CA, USA (24-26 Oct. 2001)] Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Relation between reliability and yield of ICs based on discrete defect distribution model
Tianxu Zhao,, Yue Hao,, Peijun Ma,, Taifeng Chen,Year:
2001
Language:
english
DOI:
10.1109/DFTVS.2001.966751
File:
PDF, 287 KB
english, 2001