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[IEEE 2008 54th IEEE Pulp and Paper Industry Technical Conference - PPIC - Seattle, WA, USA (2008.06.22-2008.06.27)] Conference Record of 2008 54th Annual Pulp and Paper Industry Technical Conference - Learnings from arc flash hazard assessments
Doan, Daniel R., Slivka, JenniferYear:
2008
Language:
english
DOI:
10.1109/papcon.2008.4585818
File:
PDF, 743 KB
english, 2008