[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - DFT for extremely low cost test of mixed signal SOCs with integrated RF and power management
Mittal, Rajesh, Balasubramanian, Lakshmanan, Sontakke, Adesh, Parthasarthy, Harikrishna, Narayanan, Prakash, Sabbarwal, Puneet, Parekhji, Rubin A.Year:
2011
Language:
english
DOI:
10.1109/TEST.2011.6139128
File:
PDF, 748 KB
english, 2011