[IEEE 2011 IEEE International Test Conference (ITC) -...

  • Main
  • [IEEE 2011 IEEE International Test...

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - DFT for extremely low cost test of mixed signal SOCs with integrated RF and power management

Mittal, Rajesh, Balasubramanian, Lakshmanan, Sontakke, Adesh, Parthasarthy, Harikrishna, Narayanan, Prakash, Sabbarwal, Puneet, Parekhji, Rubin A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2011
Language:
english
DOI:
10.1109/TEST.2011.6139128
File:
PDF, 748 KB
english, 2011
Conversion to is in progress
Conversion to is failed