[IEEE The Fifth International Conference on Advanced...

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[IEEE The Fifth International Conference on Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004. - Smolenice Castle, Slovakia (Oct. 17-21, 2004)] The Fifth International Conference on Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004. - Test of 24 strip line radiation detector based on semi-insulating GaAs using X-ray source

Zat'ko, B., Dubecky, F., Perd'ochova, A., Scepko, P., Melov, V., Skriniarova, J., Haupt, L.
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Year:
2004
Language:
english
DOI:
10.1109/asdam.2004.1441206
File:
PDF, 683 KB
english, 2004
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