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[IEEE 2009 Conference on Innovative Technologies in Intelligent Systems and Industrial Applications (CITISIA) - Kuala Lumpur, Malaysia (2009.07.25-2009.07.26)] 2009 Innovative Technologies in Intelligent Systems and Industrial Applications - Hybrid built-in self test (BIST) for sequential circuits
A'ain, Abu Khari bin, bin Radin Muhamad Amin, Muhamad Ridzuan, Adnan, MahmudYear:
2009
Language:
english
DOI:
10.1109/citisia.2009.5224205
File:
PDF, 785 KB
english, 2009