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[IEEE 2008 IEEE Computer Society Annual Symposium on VLSI - Montpellier, France (2008.04.7-2008.04.9)] 2008 IEEE Computer Society Annual Symposium on VLSI - Reliability of n-Bit Nanotechnology Adder
Hänninen, Ismo, Takala, JarmoYear:
2008
Language:
english
DOI:
10.1109/isvlsi.2008.6
File:
PDF, 928 KB
english, 2008