[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Back-end defect localization for 28nm FPGA
Jie Ng, Jack Yi, Ning, Liew Chiun, Ling, Khoo KhaiYear:
2014
DOI:
10.1109/ipfa.2014.6898156
File:
PDF, 624 KB
2014