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[IEEE 2010 11th International Conference and Seminar of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM 2010) - Novosibirsk, Russia (2010.06.30-2010.07.4)] 2010 11th International Conference and Seminar on Micro/Nanotechnologies and Electron Devices - Investigation of doping profile effect on characteristics of ion-implanted GaAs MESFET
Shestakov, Alexander K., Zhuravlev, Konstantin S., Arykov, Vadim S., Kagadei, Valery A.Year:
2010
Language:
english
DOI:
10.1109/edm.2010.5568833
File:
PDF, 588 KB
english, 2010