Statistical SBD Modeling and Characterization and Its...

IEEE Transactions on Electron Devices 2014 / 01 Vol. 61; Iss. 1

Statistical SBD Modeling and Characterization and Its Impact on SRAM Cells

Kim, Soo Youn, Ho, Chih-Hsiang, Roy, Kaushik
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2292060
Date:
January, 2014
File:
PDF, 897 KB
english, 2014
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