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[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - A novel mobility-variation-free extraction technique of capacitance coupling coefficient for stacked flash memory cell
Okagaki, T., Tanizawa, M., Fujinaga, M., Kunikiyo, T., Yuki, H., Ishikawa, K., Nishikawa, Y., Eimori, T., Inuishi, M., Oji, Y.Year:
2005
Language:
english
DOI:
10.1109/icmts.2005.1452270
File:
PDF, 585 KB
english, 2005