Ultrahigh Coercivity Magnetic Force Microscopy Probes to...

IEEE Magnetics Letters 2010 Vol. 1

Ultrahigh Coercivity Magnetic Force Microscopy Probes to Analyze High-Moment Magnetic Structures and Devices

Amos, Nissim, Fernandez, Robert, Ikkawi, Rabee M, Shachar, Meir, Jeongmin Hong,, Beomseop Lee,, Litvinov, Dmtri, Khizroev, Sakhrat
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Volume:
1
Year:
2010
Language:
english
Journal:
IEEE Magnetics Letters
DOI:
10.1109/lmag.2010.2050679
File:
PDF, 337 KB
english, 2010
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