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[IEEE Comput. Soc. Press IEEE International Workshop on Memory Technology, Design, and Test - San Jose, CA, USA (8-9 Aug. 1994)] Proceedings of IEEE International Workshop on Memory Technology, Design, and Test - BIST for ring-address SRAM-type FIFOs

van de Goor, A.J., Schanstra, I., Zorian, Y.
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Year:
1994
Language:
english
DOI:
10.1109/mtdt.1994.397188
File:
PDF, 622 KB
english, 1994
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