[IEEE InterSociety Conference on Thermal Phenomena in Electronic Systems, I-THERM V - Orlando, FL, USA (29 May-1 June 1996)] InterSociety Conference on Thermal Phenomena in Electronic Systems, I-THERM V - Low cycle fatigue analysis and test methodology for fine pitch leaded surface mount components
Baker, P.E., Kaspari, D.K.Year:
1996
Language:
english
DOI:
10.1109/ITHERM.1996.534547
File:
PDF, 795 KB
english, 1996