[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections
Chun, Sunghoon, Kim, Yongjoon, Kim, Taejin, Kang, SunghoYear:
2009
Language:
english
DOI:
10.1109/vts.2009.38
File:
PDF, 1.42 MB
english, 2009